Accelicon

MBP Sep, 22, 2008 Version 2008.2.0

• features and improvement
  • Engine and lib parser improved to support 45nm model library.     
  • Latest PSP and HISIM_HV version update  
  • New powerful and flexible Measurement module    
  • Task tree improved to be more efficient and robust
  • Other handy new features
  • Great improvement on internal engine
    -    Parse and tweak 45nm technology model library directly in MBP2008.2.0
    – Improve subckt model simulation capability
    – Support more HSPICE functions and elements
    – Latest model version support
          * PSP 102.3
          * HISIM_HV 1.0.2
    – Task tree speed improved
  • Device Characteristic Program (DCP)
    – Powerful new measurement module with more flexibility
    – Open structure provides user defined instrument driver, device type and analysis
    – Support meters, switch matrix and probe station to measure whole wafer or specific devices
    – Automatically save user inputs and internal debugging support
  • Task tree device selection
    – A device selection window will pop up when start a
          task tree, user could check or re-define the device
          selection by MBP default such as WmaxLmax,
          WmaxLarray, etc for the auto extraction flow
    – To make the auto extraction flow more suitable for 
          user’s own data set
    – Allow user to save the definition to a setting file and
          load for other projects
  • New PSP task tree provides Local to Global
    approach for PSP model auto extraction flow
  • IMV pages capability improved
    – New target definition, expression support for restrictions
         For example, vds=vdd/2, vds<vgs, etc
    – New plot type, two p axis support
         For example, p=vds, vgs
  • Other handy features
  • Support extend simulation on both X and P axis
  • Add FB device to the default IMV pages with the postfix “f”
  • Allow extend simulation in IMV pages
  • New feature in Binning model tweaking allow user to
    tweak the same parameter for a set of point together
    – In point mode, right-click on one parameter and select “select bin param”
  • Improved Error Table
    – Update real time when parameter changes
    – Add Relative/Absolute Error selection
    – Make the legends more clear: with second variables
  • Others
    -  User could set the ratio for extending bin boundary when generate binning model
    -  User could customize the layout by Tool -> Layout -> Customize
       – Add the column and row number of plot to the setup window
    - User could set the precision for model saving and simulation by the new button in the
    parameter window